ASTM E1382 PDF

adminComment(0)

ASTM - Epdf - Download as PDF File .pdf), Text File .txt) or read online. E() Standard Test Methods for Determining Average Grain Size Using Semiautomatic Format, Pages, Price. PDF ASTM License Agreement. ASTM E()_材料科学_工程科技_专业资料。Standard Test Methods for Determining Average Grain Size Using Semiautomatic and.


Astm E1382 Pdf

Author:MEGGAN BUCHALTER
Language:English, German, Dutch
Country:Tuvalu
Genre:Fiction & Literature
Pages:360
Published (Last):04.12.2015
ISBN:766-8-70286-362-3
ePub File Size:17.80 MB
PDF File Size:16.37 MB
Distribution:Free* [*Registration Required]
Downloads:41671
Uploaded by: HISAKO

1 These test methods are under the jurisdiction of ASTM Committee E04 on. Metallography and are E Test Methods for Determining Average Grain Size. Home; ASTM E(). $; Add to Cart. Printed Edition + PDF; Immediate download; $; Add to Cart. Designation: E − 97 (Reapproved ) Standard Test Methods for Determining Average Grain Size Using Semiautomatic andAutomatic Image Analysis 1.

Graphical data may be produced with either a printer or plotter, 7. Apparatus as desired. If ers. High levels of humidity must be avoided as staining of a digitizing tablet is utilized for the measurements, illumination specimen surfaces may occur during, or before, analysis. Very modes other than bright field may be useful for certain low levels of humidity must also be avoided as static electricity specimens. For example, for optically anisotropic materials may damage electronic components.

Vibrations, if excessive, that are difficult to etch, crossed polarized light may be must be isolated, particularly for automatic image analysis. Such images exhibit grain contrast or color differences between grains rather than 8. Sampling grain boundary delineation. These images, which usually 8.

You might also like: ASTM E PDF DOWNLOAD

Sampling location and the measurements, an upright-type metallurgical microscope is frequency should be based upon agreements between manu- preferred over an inverted microscope due to the greater ease facturers and users. A variety of approaches can be employed. The simplest is 9. Test Specimens to fix a photograph usually an enlargement to the tablet 9. However, the presence of ment done without bias , tape down the corners of the grid, and an equiaxed grain structure in a wrought specimen can only be use the cursor, fitted with fine cross hairs, to measure the determined by examination of a plane of polish parallel to the appropriate features.

Alternatively, the grid can be placed on an deformation axis. Consequently, preparation of longitudinally eyepiece reticle. The cursor is moved over the tablet surface oriented specimens, where the plane-of-polish is parallel to the and the microscopist can see the illuminated cross hairs in the deformation axis or grain elongation direction, is recom- cursor through the eyepieces over the field of view and grid mended.

A third approach is to transfer the microstructural 9. If the grain structure is not equiaxed but ments.

In this case, the grain size must sheets or as eyepiece reticles, may be utilized with a semiau- be determined on longitudinal, transverse, and planar surfaces, tomatic digitizing tablet. For counting grain boundary intersec- or radial and transverse surfaces, depending on the product tions or grains intercepted, a circular test grid, such as shape, and averaged, as described in Annex A1, to obtain the described in Test Methods E, may be used.

For measuring mean grain size.

Material modules

If directed test lines rather than random are intercept lengths, a test grid with a number of equally spaced used for intercept counts on non-equiaxed grains in plate or straight, parallel lines is used.

Grain contrast 1 and tint etchants 1,2 are very area to permit measurement of at least five fields, preferably effective because they generally provide full delineation of the more, at the necessary magnification. In most cases except for grain structure.

Adjust the stage movement so that measure for grain size because the twin boundaries are detected the interface between adjacent specimens is avoided, that is, is as well as the grain boundaries.

For such specimens, semiau- not in the field of measurement. Certain electrolytic etching techniques, 3,4 as summarized in Ref 1 Specimen Preparation will delineate the grain boundaries but not the twin boundaries Guidelines and recommended practices are given in measurement according to the McQuaid-Ehn technique, as Practice E3.

Exces- automatic image analysis is used. Specimens must be carefully cleaned and dried after polishing. The nature of the heat desired heat treated condition representative of the product, for treatment is usually important, particularly the tempering example, solution annealed, annealed, as-quenched, or temperature, if used.

Subjecting the specimen to a temper quenched and tempered.

Other treatment conditions, such as embrittlement cycle may enhance the etch response, but this as-hot rolled, as-hot forged, or as-cold drawn, may be tested as treatment is not helpful if the amounts of P, Sn, As, and Sb are required but it must be recognized that the grain structure for very low.

In general, coarse-grained specimens are more easily these conditions may not be equiaxed. Reference 1 provides Unmounted specimens Again, this technique works best analysis is to be utilized, as described in The choice of the proper etchant depends on the ization 5,6 or watershed segmentation, may be used to composition and heat treatment condition of the specimen. For complete missing grain boundaries or produce grain boundar- automatic image analysis, a flat etch condition, that is, where ies in grain contrast etched specimens.

However, these tech- the grain boundaries appear dark against a light matrix, is niques must be used with caution because skeletonization can normally required. Test Methods E and Ref 1 3 list many produce false grain boundaries and watershed segmentation suitable etchants. A very high degree of grain boundary may not produce grain boundaries between two adjacent grains delineation is required. Light pen, mouse, or trackball If 3 The boldface numbers in parentheses refer to the list of references at the end of enlargements are used, the magnification must be determined this standard.

A sufficient number of fields, selected blindly without boundaries or grain interiors to establish the correct setting of bias, must be photographed at the required magnification to the gray-level threshold controls, as described in Procedure: Semiautomatic Digitizing Tablet and alloys exhibiting properly and improperly etched grain Avoid an excessively high number of grains per photograph as counting accuracy may be impaired. To mini- Take the micrographs at random, that is, without grain elongation.

ASTM-Epdf

Fix each Calibration and Standardization micrograph to the tablet surface, for example using masking Drop the measure- magnification for each objective and eyepiece combination to ment grid onto the photograph to prevent placement bias.

Tape be used. With an inverted-type microscope, simply and determine the magnification of the enlarged micrograph in place the specimen face down on the stage plate and hold it in the same manner as described in paragraph Then, make place with the stage clamps.

With an upright-type microscope, enlargements of the grain structure images using the same place the specimen on a slide and level the surface using clay enlarger setting. Alternatively, determine the degree of enlarge- or plasticene between the specimen and slide. To avoid ment by comparing the size of features on the enlargement to problems with adherent tissue paper, follow the alternate their size on the contact print. Repeat this process for a number leveling procedure described in Practice E Procedure of features in the image.

Determine the average enlargement section. The angular of the radiating beam coincides with the optical axis or other aperture can also be controlled by the condenser lens current.

In electron optics there are physical objective aperturea metal diaphragm, centrally three general types: pierced with a small hole, used to limit the cone of electrons 1 magnetic alignmentan alignment of the electron accepted by the objective lens.

This improves image contrast optical axis of the electron microscope such that the image since highly scattered electrons are prevented from arriving rotates about a point in the center of the viewing screen when at the Gaussian image plane and therefore can not contribute the current flowing through a lens is varied.

ASTM E 7 metalografias.pdf

This is the best allotriomorphic crystala crystal whose lattice structure is choice for high resolution or color photomicrography. It is ferro-magnetic below C.

The amplifier is especially designed for flatness of field valley. This is the standard unit of athermalnot isothermal, with changing rather than constant measurement in X-ray crystallography.

Ordinarily, these structures may be electron. If austenite grain sizethe grain size which exists or existed in the transformation temperature is just below that at which austenite at a given temperature.

Standard Terminology Relating to

See Test Methods E If the transformation temperature is just records instantaneous and continuous changes in dimensions above that at which martensite is produced, the bainite and some other controlled variable such as temperature or lower bainite is acicular, resembling slightly tempered time.

At the higher resolution of the electron micro- autographic pyrometer See pyrometer. These discontinuous carbide evaluation of an image into its elements with or without plates tend to have parallel orientation in the direction of the operator interaction.

It includes the enhancement, detection, longer dimension of the bainite areas. Lower bainite consists and quantification of the features contained in an image of ferrite needles containing carbide platelets in parallel through the use of optical, geometrical, and stereological array cross-striating each needle axis at an angle of about parameters and a computer program.

Image analysis data Intermediate bainite resembles upper bainite; however, output can provide individual measurements on each sepa- the carbides are smaller and more randomly oriented. The filter materials automatic image analyzera device which can be pro- and thicknesses are chosen so that their absorption edges lie grammed to detect and measure features of interest in an very close together and so that they have the same absorption image.

It may include accessories such as automatic focus except for wavelengths lying in the range between their and an automatic traversing stage to permit unattended absorption edges. When these filters are used alternately, the operation. Balanced filters thus can be made unit volume of a substance per unit change in temperature to serve as a crude monochromator. See also average coefficient of cubical expansion and barrel distortion See distortion. Its axial ratiothe ratio of the length of one axis to that of Miller indices are or , respectively.

Any apparatus.

See also self-biased gun. These structures may be boundaries of a two-phase equilibrium and which join, 3 Licensed by Information Handling Services E7 without inflection, at a critical point. See miscibility gap. This results birefringenthaving more than one refractive index. Such in a structure exhibiting incipient melting or intergranular materials exhibit alternately bright and dark reflections at oxidation.

See also anisotropic.

The number of atoms in a body-centered cell must more positive than carbon. A standard area and is, therefore, counted only as one-half cathode lens occurs in any system in which a cathode is grain. See also Jeffries Method. It is nl 5 2d sin u 2 commonly known as iron carbide and possesses an orthor- hombic lattice. Cementite is in metastable equilibrium and has a Bragg methoda method of X-ray diffraction in which a tendency to decompose into iron and graphite, although the single crystal is mounted on a spectrometer with a crystal reaction rate is very slow.

Typically such a material is weight of the solute in an infinitely large quantity of the accompanied by documentation certificate. It is usually plotted as the density against the log brightfield illumination for reflected light, the illumination exposure. Called also the H and D curve and the sensi- which causes specularly reflected surfaces normal to the axis tometric curve.

For transmission electron characteristic radiationX-radiation of a particular set of microscopy, the illumination of an object so that it appears wavelengths, produced by and characteristic of a particular on a bright background.

Chinese script eutectica configuration of eutectic constitu- Class IV quaternary equilibriumin a four-component ents, found particularly in some cast alloys of aluminum system, the stable univariant coexistence of five phases, one containing iron and silicon and in magnesium alloys con- of which must disappear at higher temperature or pressure; taining silicon, which resembles in appearance the characters for example, the quaternary peritectic equilibrium, in Chinese script.

Class IV quinary equilibriumin a five-component system, chromatic aberrationa defect in a lens or lens system as a the stable univariant coexistence of six phases, four of which result of which the lens possesses different focal lengths for appear in both associated bivariant equilibria at temperatures radiation of different wavelengths. Because the lattice spacings are usually wavelength and a random phase relationship. Also called different, strains usually exist at the interface.

Also condensera term applied to lenses or mirrors designed to called unmodified scattering. In photography, the apparent temperature in a characteristic configuration in an alloy micro-structure.

These wires the image.Many grain size raters expressed the need for simpler ways to estimate the grain size. DOI: Sometimes they cannot be revealed, particularly in low-carbon steels. An example would be corundum or spinel difference resulting from a given exposure difference. When using an eyepiece reticle, use of a single test magnification M. It may include accessories such as automatic focus except for wavelengths lying in the range between their and an automatic traversing stage to permit unattended absorption edges.

The filter materials automatic image analyzera device which can be pro- and thicknesses are chosen so that their absorption edges lie grammed to detect and measure features of interest in an very close together and so that they have the same absorption image.